Lay, the demand for highly accelerated stress test has been increasing due to density growth of electric and electronic parts.
The Highly Accelerated Stress Test Chamber has been primarily developed to conduct bias testing which applies constant voltage and signals. The standard equipment features two control modes: [unsaturated control] and [wet saturated control], while the M-type chamber additionally offers a [wet and dry bulb temperature control] mode.
The M-type chamber conforms to the IEC60068-2-66 standard.
A double stack model allows conducting 2 different tests at the same time, achieving space optimization and time saving.

• Ease of operation
  Our chamber uses a spherical pressure vessel for uniform distribution pressure, and easy load of specimens in the test area.
• Standard safety mechanisms
  Numerous safety features equipped as standard, such as an automatic door lock system, overheat / overpressure protector.
• Automatic water supply
  The amount of water required by the humidifying heater for a test is automatically supplied from the water tank.
• 10 patterns program setting
• 12 specimen signal terminal pins （more available as option）
• Customized sliding rack （option）

• Test area
  
• Specimen signal terminal pins